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NIKON METROLOGY

Nikon Metrology acquired the X-Ray systems' division from X-TEK / Metris and offers the most complete and innovative metrology product portfolio, including state-of-the-art 2.5D vision measuring systems complemented with optical and mechanical 3D metrology solutions.
These reliable and innovative metrology solutions respond to the advanced inspection requirements of manufacturers active in consumer, automotive, aerospace, electronics, medical and other industries.

NIKON METROLOGY



XT V 160 X-Ray inspection system

 

The XT V 160 system is specifically designed for use in production lines and failure analysis laboratories. Intuitive software allows operators to visualize the most demanding defects.
The system can operate at energies up to 160 kV with up to 20 W of X-ray into a transmission target which leads to a small X-ray spot size and thus high resolution in the images.
The image intensifier and high quality CCD camera converts these images into high contrast images for image processing.
The manipulator is designed to allow viewing of the sample at tilts of up to 75 degrees and to rotate the sample. Rotate board as standard.

XT V 160  X-Ray inspection system



XT V 130 X-Ray inspection system

 

XT V 130 was designed by combining over 20-years experience in X-ray technology and intensive cooperation with customers.
This resulted in an affordable, compact and lightweight X-ray system for QA automation and execution on serial-produced electronic samples.
The system comes with a 30-130kV open micro-focus X-ray source, a 4-axis programmable manipulator and a 16-bit imaging system based on a 4” image intensifier.
A focal spot size down to 3 micron, 320x geometric magnification and tilt angle up to 60° offer excellent image quality and sufficient flexibility.
A rotate stage and CT capability are available as option.

XT V 130  X-Ray inspection system







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